失效分析彙整 - 頁2，共2 - iST宜特

2017-07-03by tanja

剖面/晶背研磨 (Cross-section/Backside)

2017-07-03by tanja

芯片去层 (Delayer)

2017-07-03by tanja

芯片开盖去除封胶 (Decap)

2017-07-03by tanja

自動曲線追蹤儀(Auto Curve Tracer, ACT)

2017-06-01by admin

半导体组件参数分析(I-V Curve)

2017-06-01by admin

超高分辨率 3D X-ray 显微镜

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X 射线检测 (2D X-ray)

2017-06-01by admin

超声波扫瞄 (SAT 检测)

2017-06-01by admin

超高分辨率数字显微镜 (3D OM)